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Characterization of Semiconductor Heterostructures and Nanostructures

CHRCTRZTN OF SEMICONDUCTR HETEROSTRCTRS & NANOSTRUCT 2

Physics

Mathematics & Science

Gt Product Group

Binding Format

Marketing Imprint Name

B2B GT

CL Carton Count

Imprint Name

B2B & B2C

Characterization of Semiconductor Heterostructures and Nanostructures is structured so that each chapter is devoted to a specific characterization technique used in understanding the properties of semiconductor quantum wells and superlattices. An additional chapter is devoted to ab initio modeling. The book has two basic aims. The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced students in physics, chemistry, materials science, engineering, and nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second to the discussion of the most peculiar and innovative examples. The topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic, etc. properties of matter at the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely hot, field of Nanotechnology.

POST SECONDARY FOUR YEAR

COLFR

COLSO

COLJR

COLSR

Duration

Duration Unit Of Measure

Transaction Type

Front Cover.
Half Title Page.
Title Page.
Copyright Page.
Dedication.
Contents.
Preface.
Contributors.
1: Introduction: The Interdisciplinary Nature of and Nanotechnology and Its Need to Exploit Frontier Characterization Techniques.
2: Ab Initio Studies of Structural and Electronic Properties.
3: Strain and Composition Determination in Semiconductor Heterostructures by High-Resolution X-Ray Diffraction.
4: Nanostructures Observed by Surface Sensitive X-Ray Scattering and Highly Focused Beams.
5: Small-Angle X-Ray Scattering for the Study of Nanostructures and Nanostructured Materials.
6: Local Structure of Bulk and Nanocrystalline Semiconductors Using Total Scattering Methods.
7: X-Ray Absorption Fine Structure in the Study of Semiconductor Heterostructures and Nanostructures.
8: Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures.
9: Micro- and Nano-X-ray Beams.
10: Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures.
11: Imaging at the Nanoscale: Scanning Probe Microscopies Applied to Semiconductors.
12: Photoluminescence Characterization of Structural and Electronic Properties of Semiconductor Quantum Wells.
13: Cathodoluminescence of Self-Assembled Nanosystems: The Cases of Tetrapods, Nanowires, and Nanocrystals.
14: The Role of Photoemission Spectroscopies in Heterojunction Research.
15: Electrical and Electro-Optical Characterization of Semiconductor Nanowires.
16: Electron Spin Resonance of Interfaces and Nanolayers in Semiconductor Heterostructures.
17: Raman Spectroscopy.
Index.

Characterization of Semiconductor Heterostructures and Nanostructures.css-1p8rvzy{position:absolute;padding-left:8px;}

Characterization of Semiconductor Heterostructures and Nanostructures