footer-menu

Academic Institutions

K-12

Public Libraries

Government and Special Libraries

Statewide Programs

Institutions

Databases

Primary Sources

Digital Humanities Tools

eLearning

Schools/K-12 Curriculum

Books

Large Print Books by Thorndike Press

Products

Find Your Rep

Product Support

Technical Support

Customer Support

Admin Tools

Accessibility Policy

Support

About Us

Blogs

Press Center

Events

News

Careers

Partnerships

Contact Us

Our Company

mega-menu

Browse by Institution Type

Browse by Product Type

config

Account Information

bundle-connector

products

Marketing materials, training documents, discovery services

cengage:card

FIND YOUR SALES REPRESENTATIVE

cengage:column

Get marketing materials, training documents, discovery services.

PRODUCT SUPPORT

CUSTOMER SUPPORT

Report technical issues, errors, check system status

TECHNICAL SUPPORT

Manage product preferences, generate usage reports, simplify administrative tasks.

ADMIN TOOLS

support

cengage:galethorndikeseo

secondary-storefront-menu

International

North America

China

Japan

Latin America

Brazil

Region

Set your region:

zone2

Would you like to go to the Gale {{RECOMMENDED_COUNTRY}} site instead?

It looks like you're visiting from {{DETECTED_COUNTRY}}.

main

%1 products have been added to your cart but %2 have been backordered and will be fulfilled when stock is available

Product on backorder

Current quantity limit is [maxProductQuantity], please, navigate to the cart page and change quantity of product

You will be able to resubmit promo in ${countdown} seconds. test

Please note that the taxes displayed on our website are estimated and subject to adjustment. The actual tax charges will be determined and settled during the final invoicing of your order

product-detail-component

secondary-account-menu

Profile

Orders

Wish List

Fast Order Entry

My Account

header-component

secondary-primary-menu

Request a Trial

zone3

zone1

footer-menu-component

gale-footer

header

FIND YOUR REP

support-order-2

footer-legal-menu

Terms of use

Privacy

footer-social-menu-component

container

footer

You may already have access to Gale content through your institution.

STUDENTS AND RESEARCHERS

support-order-1

footer-social-menu

Sign Up for Emails

CONNECT WITH GALE

Stay up-to-date with the latest Gale news, exclusive offers, and more.

facebook

linkedin

instagram

youtube

SOCIAL ICONS

footer-legal-menu-component

single-column

Bias Temperature Instability for Devices and Circuits

BIAS TEMPERATURE INSTABILITY FOR DEVICES AND CIRCUITS

Engineering

Mathematics & Science

Gt Product Group

Binding Format

Marketing Imprint Name

B2B GT

CL Carton Count

Imprint Name

B2B & B2C

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Post Secondary Four Year

PROFESSIONAL & REFERENCE

College Freshman

College Junior

College Sophomore

College Senior

Duration

Duration Unit Of Measure

Transaction Type

Front Cover.
Half Title Page.
Title Page.
Copyright Page.
Editorial.
Contents.
1: Part I.
2: Bias Temperature Instability Characterization Methods.
3: Application of On-Chip Device Heating for BTI Investigations.
4: Statistical Characterization of BTI-Induced High-k Dielectric Traps in Nanoscale Transistors.
5: The Time-Dependent Defect Spectroscopy.
6: Analysis of Oxide Traps in Nanoscale MOSFETs Using Random Telegraph Noise.
7: BTI-Induced Statistical Variations.
8: Statistical Distribution of Defect Parameters.
9: Atomic-Scale Defects Associated with the Negative Bias Temperature Instability.
10: Charge Properties of Paramagnetic Defects in Semiconductor/Oxide Structures.
11: Oxide Defects.
12: Understanding Negative-Bias Temperature Instability from Dynamic Stress Experiments.
13: Part II.
14: Atomistic Modeling of Defects Implicated in the Bias Temperature Instability.
15: Statistical Study of Bias Temperature Instabilities by Means of 3D &#x201C;Atomistic&#x201D; Simulation.
16: A Comprehensive Modeling Framework for DC and AC NBTI.
17: On the Microscopic Limit of the RD Model.
18: Advanced Modeling of Oxide Defects.
19: The Capture/Emission Time Map Approach to the Bias Temperature Instability.
20: Part III.
21: Impact of Hydrogen on the Bias Temperature Instability.
22: FEOL and BEOL Process Dependence of NBTI.
23: Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors.
24: NBTI and PBTI in HKMG.
25: PBTI in High-k Oxides.
26: Characterization of Individual Traps in High-&#x03BA; Oxides.
27: NBTI in (Si)Ge Channel Devices.
28: Characteristics of NBTI in Multi-Gate FETs for Highly Scaled CMOS Technology.
29: Bias-Temperature Instabilities in Silicon Carbide MOS Devices.
30: Part IV.
31: On-Chip Silicon Odometers for Circuit Aging Characterization.
32: Multilevel Reliability Simulation for IC Design.
33: Charge Trapping in MOSFETS: BTI and RTN Modeling for Circuits.
34: Simulation of BTI-Related Time-Dependent Variability in CMOS Circuits.

Bias Temperature Instability for Devices and Circuits.css-1p8rvzy{position:absolute;padding-left:8px;}

Bias Temperature Instability for Devices and Circuits